Reliability of CMOS Analog ICs

Kuntman H., KAÇAR F., Özenli D., ÖZÇELEP Y.

Analog Circuits and Signal Processing, Springer, ss.1-94, 2025 identifier

  • Yayın Türü: Kitapta Bölüm / Araştırma Kitabı
  • Basım Tarihi: 2025
  • Doi Numarası: 10.1007/978-3-031-85455-2
  • Yayınevi: Springer
  • Sayfa Sayıları: ss.1-94
  • Anahtar Kelimeler: Analog Filters, Analog IC Design, CMOS Circuit Design, Power MOSFET degradation, reliability model for PMOS and NMOS transistors
  • İstanbul Üniversitesi-Cerrahpaşa Adresli: Evet

Özet

This book presents recent advances in reliability investigation of MOS transistors and their applications. Theory and experimental results are discussed, in order to demonstrate the efficacy of the techniques presented. Readers will be enabled to improve their designs in application areas of analog signal processing, ranging from very low frequencies at several Hz levels of biomedical signals to RF applications operating at GHz level, from EEG signals to cognitive radio and encrypted communications or low-noise amplifiers in wireless communications.