In-Situ XRD Measurements and Simulations to Determine Grain Sizes in GeSbTe at Various Annealing Temperatures

ÇİL K., Woods Z., ADNANE L., CYWAR A., DIRISAGLIK F., ZHU Y., ...More

Materials Research Society (MRS) 2015 Fall Meeting, Boston, United States Of America, 29 November - 04 December 2015, vol.KK, no.321, pp.321, (Full Text)

• Publication Type: Conference Paper / Full Text
• Volume: KK
• City: Boston
• Country: United States Of America
• Page Numbers: pp.321
• Istanbul University-Cerrahpasa Affiliated: No