Generalized regression neural network-based efficient noise modeling for microwave transistors

GÜNEŞ F., Özkaya U., Uluslu A. A.

2011 International Symposium on INnovations in Intelligent SysTems and Applications, INISTA 2011, Istanbul-Kadikoy, Türkiye, 15 - 18 Haziran 2011, ss.212-216, (Tam Metin Bildiri) identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Cilt numarası:
  • Doi Numarası: 10.1109/inista.2011.5946067
  • Basıldığı Şehir: Istanbul-Kadikoy
  • Basıldığı Ülke: Türkiye
  • Sayfa Sayıları: ss.212-216
  • İstanbul Üniversitesi-Cerrahpaşa Adresli: Hayır

Özet

In this paper, a simple, accurate, fast and reliable black-box modeling is presented for the noise characterization of a microwave transistor using GRNN. GRNN-based modeling is applied to a chosen microwave transistor VMMK 1225 with an optimized training data set and the results are given in details. © 2011 IEEE.